[BrokenVision]태양광 전지 웨이퍼 Broken 검사장비

Key Benefits[English]brokenVision_장비

  • wafer의 edge에 있는 Broken defect를 검사하여 양/불량을 결정
  • 웨이퍼 이미지를 PC에 저장하며, 결함의 크기, 위치 등에 관한 정보를 기록
  • 초기 설정 이후에 촬영, 검사, 기록 등의 모든 검사 과정은 자동으로 이루어지며, 필요에 따라 자동, 수동 모드를 선택 가능
  • External Digital I/O

 

System Configuration

Modules H/W S/W
Broken Vision Camera, Light, USB Dongle Inspection S/W

Spec.

Detail Items Specification Detection Note

H/W

Specification

Camera Image Size 1.4M pixels(1280×960)
FOV 213mm x 160mm
Pixel resolution 0.167mm
Interface USB 2.0
Light Backlight Supply Voltage : 15V
Output Current(DC) : 1A(max)
Interface : RS485
Operating Temperature : 0~80℃
External I/O Digital I/O 16 channel input16 channel output
Vision Spec Surface defect Broken >2mm x 2mm

Applicable Solar Wafer

Item Detail
Wafer types Mono Crystal / Multi Cristal
Size 5”(125 x 125) / 6”(156 x 156)
Slicing Method Slurry wire cut, diamond wire cut

 User Interface

BrokenVision<Broken Vision>

Camera Spec

Modules Main Component Pixel Size
BrokenVision CCD Sensor 3.75㎛ x 3.75㎛

Speed

Items Detail
Throughout 2100 wafers / hour
Conveyor Speed 300mm/sec

Defect Image

Defect<Defect> no_defect<No Defect>


Related Products

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  • SawMark : Surface SawMark Inspection S/W for Front End Solar cell Inspection Process
  • Vision System

 

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